Battery Manufacturing EquipmentHangke solid-state-cell high-rate DCIR test equipment
Hangke's solid-state DCIR tester measures direct-current internal resistance with short, high-rate charge and discharge pulses and uploads the results. Hangke stresses large-current operation, stability and conditions close to real use. The current entry reads 800 A–800000mA, two equal values, so ask Hangke for the real current range before ordering.
The 800 A current entry
Hangke labels the test current 800 A–800000mA and promotes large-current operation, stability and relevance to real operating conditions. Since 800000mA is the same as 800 A, the entry gives one value twice. Ask Hangke for a corrected current specification that states the minimum and maximum, and whether the figure is a peak, a continuous limit, a per-channel rating or a system total.
The introduction says the machine measures DCIR with short high-rate charge and discharge pulses and uploads the results. It gives no pulse length, sampling definition, channel count, voltage range or DCIR accuracy, so ask for all of them. Set a safe test current for your cell and the duty cycle you want to simulate in the order, and plan a production acceptance run.
| Parameter | Published value | Record status |
|---|---|---|
| Original current entry, to confirm range | 800A–800000mA | known |
Catalogue values apply to the configuration and test method the maker states. Ask for the values that apply to your configuration.
Source references: s1
Cell restraint and test conditions
Solid-state cells may need restraint or compression while they are tested. This DCIR page names no pressure fixture, and the pressure figures on Hangke's formation and insulation-test machines belong to those machines. Send the test-cell drawing, terminals and the cell maker's approved operating limits, then ask whether the offered fixture keeps contact and supports the cell through the pulse.
Define the state of charge, temperature, rest time and allowed electrical excursion. Ask Hangke for the sensing layout, timing resolution, calibration method and how a contact fault is handled. A high-rate DCIR comparison needs a repeatable recipe and fixed boundary conditions. If a pressure-assisted fixture is offered, get its drawings, force and area definition and a safety review in the signed offer.
Test sheet, acceptance and records
Ask for a test sheet showing the actual current and time waveform, the voltage readings used to calculate DCIR and the calibrated references. Agree repeat and cross-channel comparisons on representative cells within their approved limits. Define which abnormal results mean a bad cell, which mean an invalid test and which need a repeat measurement.
The upload should keep cell ID, method version, time, temperature and fixture conditions with each result. Ask how incomplete runs and repeat uploads are recorded and how a downstream sorter receives the decision. At handover, collect the corrected electrical limits, contact maintenance, utility and heat-rejection scope, and isolation and recovery instructions. Choose a high-current recipe only after Hangke has corrected the 800 A entry in writing.
Source references: s1
Questions that change the purchase
| Decision | What the catalogue says | Next step |
|---|---|---|
| What is the actual current specification? | The catalogue gives 800 A–800000mA, two equal values. | Get corrected per-channel, peak and continuous limits with voltage conditions. |
| Does the cell need restraint during DCIR? | The catalogue names no compression fixture for this tester. | Approve the test-cell boundary and any fixture offered separately. |
| How is an invalid measurement distinguished from a bad cell? | The catalogue gives no accuracy, pulse recipe or retest logic. | Agree the waveform, uncertainty and data and decision procedure. |
Prepare the supplier conversation
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Sources and check dates
The maker's own pages and public records used for this page, each with the date it was checked.
s1 · Hangke solid-state-cell high-rate DCIR test equipment original public data
Hangke Technology · Manufacturer-origin source
Describes the high-rate pulse DCIR method, data upload and the 800 A current entry.
Archived source check: 2026-10-11
s2 · Hangke original post-processing equipment portfolio
Hangke Technology · Manufacturer-origin source
Shows the DCIR tester among Hangke's solid-state cell equipment.
Archived source check: 2026-10-11
Still to confirm
- The real current range, given the 800 A–800000mA entry, and whether it is peak, continuous or per channel.
- Channel count, voltage range and pulse timing.
- DCIR measurement accuracy.
- Whether a restraint fixture is supplied for solid-state cells.
High-current pulse DCIR testing of solid-state cells
- Corrected current and voltage specification and channel concurrency
- Pulse waveform, sampling windows and DCIR calculation
- Cell terminal drawing, restraint and approved operating limits
- SOC, temperature and rest conditions and calibration references
- Invalid-test and retest rules and downstream decision interface
- Uploaded ID and method records, utilities and safe recovery